Equipment Model

Holmarc HO-SE-01

Description

Ellipsometer is widely used for thin film analysis and measurements.

Lab

CIF Room No: 2102 (Physics Lab)

Institute

Central Analytical Laboratory

Location

CIF Room No: 2102 (Physics Lab), Birla Institute of Technology & Science, Vidya Vihar, Pilani, Rajasthan 333031, India

• Applications

  • Thin film thickness measurement

  • Refractive index and extinction coefficient analysis

  • Characterization of optical properties of materials

  • Surface roughness analysis

  • Quality control in thin film deposition processes

• Key Features

  • Variable angle measurement capability

  • High precision and accuracy in thin film analysis

  • Wide spectral range for diverse applications

  • User-friendly software for data analysis

  • Compact and robust design

  • Non-destructive testing of samples

• Limitations

  • High cost of equipment

  • Requires trained personnel for operation

  • Limited to thin film and surface analysis

  • Sensitive to environmental factors like vibration

  • Complex calibration process for accurate results