Birla Institute of Technology And Science
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Variable Angle Spectroscopic Ellipsometer
Equipment Model
Holmarc HO-SE-01
Description
Ellipsometer is widely used for thin film analysis and measurements.
Lab
CIF Room No: 2102 (Physics Lab)
Institute
Central Analytical Laboratory
Location
CIF Room No: 2102 (Physics Lab), Birla Institute of Technology & Science, Vidya Vihar, Pilani, Rajasthan 333031, India
Applications
Thin film thickness measurement
Refractive index and extinction coefficient analysis
Characterization of optical properties of materials
Surface roughness analysis
Quality control in thin film deposition processes
Key Features
Variable angle measurement capability
High precision and accuracy in thin film analysis
Wide spectral range for diverse applications
User-friendly software for data analysis
Compact and robust design
Non-destructive testing of samples
Limitations
High cost of equipment
Requires trained personnel for operation
Limited to thin film and surface analysis
Sensitive to environmental factors like vibration
Complex calibration process for accurate results
Pricing
Price On Request
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