Equipment Model

FEI Apreo LoVac

Description

The FEI Apreo LoVac FESEM is a high-resolution electron microscope designed for capturing detailed topographical and compositional information of sample surfaces at magnifications ranging from 10x to 300,000x. It offers exceptional surface imaging with a resolution of 1.5 to 2 nm and supports imaging of non-conductive samples through inverse bias mode, minimizing the need for coating.

Lab

CIF Room No: 3181

Institute

Sophisticated Instrumentation Facility

Location

CIF Room No: 3181, FD-III, Pilani Campus Vidya Vihar, Pilani, Rajasthan 333031, India

• Applications

  • Material science: Surface morphology and microstructure analysis of metals, polymers, ceramics, and composites.

  • Semiconductor industry: Inspection of microelectronics and thin films.

  • Biological research: Imaging of biological samples with structural preservation.

  • Nanotechnology: High-resolution imaging of nanomaterials and nanoparticles.

  • Forensics and failure analysis: Examination of fracture surfaces, wear patterns, and contaminant residues.

• Key Features

  • High-resolution imaging down to 1.5–2 nm.

  • Wide magnification range from 10x to 300,000x.

  • Low vacuum mode enables imaging of non-conductive and hydrated samples without coating.

  • Virtually unlimited depth of field for detailed 3D surface views.

  • Advanced detector configuration for topographical and compositional contrast.

• Limitations

  • Preparation of biological or non-conductive samples may still require special techniques.

  • Not suitable for imaging internal structures without cross-sectioning.

  • Operational expertise required for optimal performance and interpretation.