Equipment Model

Rigaku XtaLAB Pro-II

Description

The Single Crystal X-ray Diffractometer is an advanced tool used to obtain detailed crystallographic data of single crystals. It provides information about the internal lattice of crystalline substances, including unit cell dimensions, bond lengths, bond angles, and site-ordering. The instrument's precision allows for crystal structure interpretation and refinement.

Lab

CIF Room No: 2126

Institute

Sophisticated Instrumentation Facility

Location

CIF Room No: 2126, FD-II, Pilani Campus Vidya Vihar, Pilani, Rajasthan 333031, India

• Applications

  • Determination of crystal structures of organic and inorganic compounds

  • Characterization of small molecules and materials

  • Analysis of molecular symmetry, atomic positions, and bond lengths

  • Phase identification in polycrystalline materials

  • Quality control of crystallography samples

  • Nanomaterials and molecular engineering studies

• Key Features

  • High-resolution X-ray diffraction for accurate crystal analysis

  • Single-crystal refinement for structure elucidation

  • Advanced detector system for enhanced data collection

  • Precise unit cell and site-ordering analysis

  • Capability for both high- and low-temperature measurements

  • User-friendly software for data processing and structure visualization

• Limitations

  • Not suitable for polycrystalline or amorphous materials

  • Sample size and symmetry may limit certain analyses

  • Sensitive to sample imperfections and impurities

  • High maintenance cost and calibration requirements