Equipment Model

Horiba LabRam HR Evolution

Description

A high-resolution Raman spectrometer used to examine microscopic areas of materials with minimal sample preparation. The system is capable of focusing a laser beam down to the micrometer scale for precise spectral analysis. Integrated with Atomic Force Microscopy (AFM), it allows concurrent topographical and chemical characterization at the nanoscale.

Lab

CIF Room No: 1129

Institute

Sophisticated Instrumentation Facility

Location

CIF Room No: 1129, FD-II, Pilani Campus Vidya Vihar, Pilani, Rajasthan 333031, India

• Applications

  • Chemical composition analysis

  • Crystallinity and phase identification

  • Stress and strain mapping in materials

  • 2D material and nanostructure characterization

  • Polymer, pharmaceutical, and semiconductor studies

  • Correlated AFM-Raman imaging

• Key Features

  • High spectral resolution Raman analysis

  • Laser focusing down to micrometer scale

  • Minimal sample preparation required

  • Integrated AFM for atomic-level topography mapping

  • Compatible with solid, liquid, and thin film samples

  • Suitable for mapping and depth profiling

• Limitations

  • Fluorescent samples may interfere with Raman signals

  • Surface contamination can affect accuracy

  • Requires careful calibration and alignment

  • AFM operation requires vibration-free environment

  • Limited to surface or near-surface analysis